SB1341-16-RQ-0532_SOW.pdf

STATEMENT OF WORK

TITLE: Atomic Force Microscope System

LAB REQUESTING SERVICE: Material Measurement Laboratory, Biosystems and Biomaterials Division

I. BACKGROUND INFORMATION

A high resolution atomic force microscope (AFM) is needed to provide fundamental multiscale morphological, physical and mechanical information for tracking the adhesive interaction of dental materials with microbial and mammalian cells, as well as dental adhesives with tooth structure. This acquisition supports MML’s Biomaterials for Oral Health Program and is critical for meeting milestones in the Interagency Agreement between NIST and NIDCR/NIH as well as other projects. (e.g., cell-materials interaction). The AFM will provide needed capability for measuring nanoscale changes in the adhesive interaction for use in prediction of anti-microbial, osseointegration, and remineralization performance of new class of dental materials. The Material Measurement Laboratory’s Biomaterials group operates an AFM (Model: Bioscope II, Veeco Instrument, Inc.), which is almost 14 years old and is not supported by the manufacturer anymore since Veeco’s metrology business (including Veeco AFM instrument) was bought by Bruker Corporation in 2010.

SPECIFICATIONS

The Contractor shall furnish one atomic force microscope system, including integrated scanning and probing, as well as computerized analysis system, and documentation. Beyond the stated hardware compatibility requirements, the major components of the new AFM system, along with the function and performance of these components, are specified as follows:

System Requirements:

1. The AFM shall use a closed-loop, “sample scanning” design wherein the AFM probe moves in the Z axis and the sample is scanned in X&Y axis. The system shall include synchronization of AFM and optical data collection fully implemented within the AFM software interface. AFM scanning and optical image acquisition take place sequentially to eliminate noise and interference from either measurement. Optical images can be automatically acquired at the end of each AFM scan line, at the end of each AFM image frame, or during force curve measurements (at the end of the approach or the end of retract.).

The AFM shall be integrated and be compatible with the Biomaterials Group’s existing automated inverted optical microscope system ( Serial Number: AXIOOBSERVER Z1, Motorized microscope with fluorescence, phase contrast, motorized x,y stage, and Apotome, Carl Zeiss Microscopy, LLC).

2. The AFM shall include both the peak force quantitative nanomechanical mapping mode as well as high speed force volume imaging mode. The former is defined as an imaging mode wherein the force distance curve is made using a sinusoidal Z motion and ramp rates from 125Hz up to 2 KHz. The latter is defined as when nano-mechanic measurements (force curves) are made in the 0.1 to 300 Hz range using linear Z ramping. These force curves can then be made in an array to create an image/map. Details of each mode are as follows:

a) Peak force quantitative nanomechanical mapping mode: This mode must provide the ability to collect and analyze full force-distance curves at each pixel in an image using sinusoidal Z motion with ramp rates from 125Hz to 1 kHz in fluid and 2 kHz in air.

Enable mapping at 256x256 pixels in less than 2 minutes

Feedback loop implemented to maintain maximum tip-sample interaction force with force control down to 10 pN with ramp rates from 125Hz to 2kHz

Automated scan parameter optimization of feedback (force) set point, gain & scan speed

Simultaneous real-time acquisition, calculation and display of topography, elastic modulus, hardness, adhesion, deformation and energy dissipation in SI units.

To ensure accuracy of mechanical data, background effects such as viscous damping should be subtracted with real-time compensation for every pixel

Up to 5000 x 5000 pixel resolution required for all channels Offline analysis to analyze data cubes for slices and property maps including modulus (at least 3 models), hardness, adhesion

b) Force volume imaging mode: This mode must provide the ability to collect and analyze full force-distance curves at each pixel in an image using linear Z ramping with ramp rates from 0.1Hz to 300Hz

Enable mapping at 256x256 pixels in less than 10 minutes Simultaneous real time acquisition, calculation and display of topography, modulus, adhesion, hardness in SI units.

To enable low force triggering allow compensation for false deflection for each curve.

3. FM shall include the following scanning stage and AFM head features:

High stability sample mounting by both magnetic clamps for slides and cover slips, and vacuum sealing for petri dishes Head shall allow open physical access to sample from above while the AFM head is in place (test: typical 1mL pipetter can add fluid to 35mm petri dish without removing the AFM head)

850nm IR super luminescent diode Less than 150 pm RMS noise in XY when installed in proper vibration table with acoustic shielding XY range at least 100x100um Less than 0.25 nm/micron false deflection over the complete Z range Less than 30pm height noise when installed in proper vibration table with acoustic shielding Uses a decoupled scanner design, where sample is scanned in XY and probe in Z.

Probe holder for use in fluid should allow simple exchange of the AFM probe. The clip securing the probe must be permanently attached to the probe holder body to prevent loss.

4. AFM shall include specific, dedicated AFM probes as follows:

high resolution imaging probe that enable resolution of DNA Double Helix and

Bacteriorhodopsin trimer structure without tip artifacts cell imaging probe at least 17 µm in length that allow live cell imaging without tip artifacts

5. AFM shall include the following optical integration features:

Adequate clearance for a turret of at least three objectives Compatible with objectives of numerical aperture (NA) ≥ 0.5 Compatible with oil immersion (NA>1.0) objectives

0.35 NA condenser compatibility (while AFM head mounted)

Optical images can be acquired, stored and displayed in real-time (including AFM overlay) at: the end of each scan line, the end of a user-defined number of lines, the end of frame, the end of ramp segment

Saved optical and AFM data shall automatically overlaid when re-opened Integration with Andor iXonEM, Hamamatsu ORCA, Hamamatsu Flash CMOS, and

Photometrics CoolSNAP cameras Direct optical image acquisition that is saved in AFM software

6. AFM shall include a docking / probe-alignment station to place the AFM head when not mounted on the inverted optical microscope (IOM). Docking station shall include all of the following:

Allows the user simple alignment of the laser with the cantilever, in both air and in fluid.

Illuminator co-axial with the laser incidence beam Integrated color camera, with image displayed directly into the AFM software Allows the user to keep the tip in liquid at all times. This includes during laser alignment and while mounted on the existing IOM (AXIOOBSERVER Z1 Motorized microscope with fluorescence, phase contrast, motorized x,y stage, and Apotome, Carl Zeiss Microscopy, LLC).

7. Key features the AFM shall also include are:

Sample heater that includes:

o Temperature control up to 40°C while imaging and up to 60° for sample processing o Includes evaporation shield to maintain fluid environment within the petri dish

Compatible with microscope slides, cover slips, plastic petri dishes (60 and 35mm), and glass bottom petri dishes (50mm).

Installation and Training:

The Contractor shall install the instrument in Building 224, Room A122, at NIST Gaithersburg, MD. Installation shall include, at a minimum, uncrating/unpacking of all equipment, set-up and hook-up of all equipment, start-up, demonstration of specifications, and removal of all trash.

Instrument will operate to manufacturer’s specifications upon installation. Installation and training shall take place during normal business hours, between 8:30 am and 5:00 pm Eastern Time, Monday through Friday except Federal Holidays, and shall be coordinated with the NIST Technical Point of Contact (TPOC). Installation shall occur within eight (8) weeks of award.

Warranty:

The Contractor shall provide, at a minimum, a one-year warranty for the equipment. The warranty must cover all parts, labor and travel. The warranty shall commence upon successful completion of delivery, installation and demonstration of all required specifications.

II. PERIOD OF PERFORMANCE

The period of performance is 75 days after award.

III. DELIVERABLES

Description Quantity Due Date the Atomic Force Microscope system (including installation of the system

1 60 days after award of this requirement.

Installation and Training 1 Within 15 days after delivery

Freight/Shipping Charges: Delivery terms will be FOB Destination. FOB Destination means:

The contractor will pack and mark the shipment in conformance with carrier requirements, deliver the shipment in good order and condition to the point of delivery specified in the purchase order, be responsible for any loss of and/or damage to the goods occurring before receipt and acceptance of the shipment by the consignee at the delivery point specified in the purchase order; and pay all charges to the specified point of delivery. The contractor shall have the automated microscope system delivered to NIST, Gaithersburg, MD 20899.

IV. GENERAL INFORMATION

Safety: The Contractor employee must be responsible for knowing and complying with NIST installation safety prevention regulations (http://www-i.nist.gov/mml/safety/policies/index.htm.)

Such regulations include, but are not limited to, general safety, fire prevention, and waste disposal.

Security: NIST is a restricted campus. An identification badge is required for access for entry into buildings and also is shown to the armed Security Police when entering the campus.

Vehicle Registration: All Contractor employees must register their vehicles with the NIST Security Office to gain access to the campus. A valid driver’s license, Government-furnished civilian ID, proof of insurance and current registration must be presented to the NIST Security Office, at which time a NIST vehicle pass will be issued. The pass must be displayed on the vehicle’s rear view mirror in accordance with instructions. The Contractor employee must follow NIST procedures for removal and turn-in of the vehicle pass upon termination of services under this contract.