SATPC0031902 Tab 04 4 SOW.pdf

STATEMENT OF WORK

1. Objective/Requirements NASA Ames Research Center has a requirement for a Rigaku MiniFlex 6G Benchtop X-ray Diffraction System.

2. Characteristics, Scope, and Specs The contractor shall provide the following configuration for this system:

Quantity Part Number Item Description 1 1018885 MiniFlex 6G 6th

Generation Benchtop X-ray Diffractometer*

1 1005370 900876

X-ray Tube: Normal Focus, Cu Target

• • Normal Focus, 1 x 10mm. Cu target

• • P8V O-Ring (1 Set) (2401P8V)

1 1010564

Sample Spinner Allows a single sample to be rotated during data collection to bring more particles into the X- Ray beam, which can result in more representative measured intensities.

1 1021071

Bulk Sample Holder with adjustable Manual Z height

1 1016621

Zero Background, Sample Holder, Round for ASC-8, Surface Flush with Sample Holder, 5mm dia. Hole with 0.2mm depression. Sample Size: 1-2 mg

1 1019277

D/teX Ultra 0D / 1D High Speed Detector for MiniFlex 6G **

1 1020812

Variable Knife Edge (VKE) for D/teX Ultra and HyPix400MF

1 PC-XRD

Computer Configuration for X-Ray Diffraction ***

1 1021831

SmartLab Studio II Software

- Ten(10) User Network License ****

1 1020506

SmartLab Studio II Powder Basic Analysis Plugin *****

1 A00010712

SmartLab Studio II Direct Derivation (DD) Plugin

1 1020508

SmartLab Studio II Powder Qualitative (Search) Analysis Plugin

1 CDD-AX

PDF-4/Axiom

1 903773RTW

On-line MiniFlex Training Course

1 903773RTW

Additional Day of On-line MiniFlex Training Course

1 903773WP

ON-SITE REPAIR, ONE

YEAR PARTS AND LABOR

*The system features:

• 600W X-ray Generator (Highest Power Generator in a Benchtop XRD)

High-frequency, 0.60 kW (40 kV and 15 mA) Power requirements: 115V, 60 Hz, single phase, 10 A.

X-ray tube take-off angle: 6° Electronic display panel showing generator and detector electronics status.

Interlocked radiation enclosure with X-ray ON lamp.

1.3 kW Air-Cooled Ultra Quiet Heat Exchanger o Highly Reliable Goniometer Highly reliable and rugged vertical goniometer with sample mounted in horizontally.

Goniometer range: -3° to ~ 145° 2θ Scanning speed: 0.01° - 100° 2θ / min 150 mm radius minimizes intensity loss due to air scattering.

Standard sample stage for a wide range of standard sample holders and accessories.

o Slit Assembly

• Continuously variable, theta-compensating, divergence slit provides superior low angle diffraction performance.

• Scattering slit, 8mm

• Soller slits, 2.5° incident and 2.5 receiving

• Receiving slit, 0.3 mm.

o Associated items

• Footprint Dimensions: 21.3 in x 18.2 in x 27.6 in (W x D x H)

• Weight: ~ 176.4 lbs.

• MiniFlex Start-up Manual

• NBS 111 Hand Book

Accessories Kit with:

o Ni Kß filter for Cu radiation o Si reference specimen o (5) Aluminum backfill sample holder 20 x 20 mm o (2) Glass 0.2 mm depression 20 x 20 mm o (2) Glass 0.5 mm depression 20 x 20 mm o Spring clip to mount slides o Direct Beam Absorber o Anti-scatter Protector

**Specifications:

• Compound silicon strip solid state 1D detector

• 12.8mm x 20mm Active Area

• 100μm pixels x 128 channels

• 106 cps/pixel Count Rate

• 1.9 x 1010 cps Global Count Rate

• Programmable energy resolution modes available ͦ Point detector equivalent 0D mode ͦ High speed 1D mode ͦ Fluorescence suppression

• Maximum scan speed: 100 deg/min

***Specifications:

• Intel CoreTM i7 Processor

• 8.0 GB RAM

• Dual-band 802.11ac Wi-Fi with Bluetooth 5

• Internal Audio Speaker

• 24” Dell Flat Panel LCD

• Dual Monitor Capability

• 512 GB Hard Drive, SSD

• 8X DVD+/-RW, 9.5 Optical Disk Drive

• 4 USB ports, 2 on the front, 2 on back

• 6 USB3 ports 2 on the front, 4 on the back

• Keyboard, USB 2 Button Scroll Mouse and Pad

• Microsoft Windows 10 PRO, 64 bit

• MS Office 2021 Home and Business

• Adobe Acrobat Reader

• Two (2) Ethernet Ports required

• 3 yr Basic Limited Warranty, 3 yr NBD On-Site Service from Dell

****Specifications:

XRD Measurement Plugin

• Instrument control, system status, and device configuration.

• Optical recognition and graphical display of optical system configuration.

• Measurement center for all user defined measuring conditions.

Data Manager Plugin

• No more redundant login screens with automatic login.

• Data files shown in thumbnail images or detailed information displays.

• Available data analysis programs are highlighted for selected data files.

• Find data based on data type, date, owner, etc.

*****Specifications:

Display Features

• Zoom, reset, and pan.

• Multiple pattern overlays in 2D and 3D.

• Hiding analysis results to show raw data only.

• Switching 2 theta axis to S or Q.

• Customizing line colors, widths, and markers.

• Windows clipboard support for copy and pasting into other applications.

• Thumbnail viewing.

• Drag and drop from Explorer.

• Access to your ICDD database for overlays and card printing.

• View crystal structures in 3D with real-time manipulation.

Data Reduction Features

• Automatic data reduction and peak list reporting.

• Sonneveld-Visser and polynomial function background elimination.

• Rachinger method Kα2 elimination.

• Automatic and/or manual peak finding.

• Peak-top and second-derivative peak finding.

• Gaussian moving average, Savitzky-Golay, optimized Gaussian moving average, and B-spline smoothing.

• Beam footprint and absorption corrections for variable slit.

• Absorption correction for capillary.

• LP correction for monochromators.

Data Analysis Features

• Simultaneous processing of multiple patterns.

• Automatic individual parameter fitting.

• RIR quantitative analysis using imported phase information.

Included

• Crystallite size determination using a single diffraction peak (Scherrer’s equation) with and without an external standard reference material.

• Boolean search of ICDD PDF databases.

Data Input/Output Features

• Universal ASCII pattern file import and export.

• Detailed processing logs.

• Import/export d-I and IUCr CIF files.

• Microsoft Word report file creation.

• Online PDF manual.

• Easy creation & management of searchable database from ICDD & user defined phases

• d-I list editing and file import.

Additional Notes:

The XRD shall have the following minimum requirements:

• Benchtop XRD system must be capable of operating at 600-watts of X-ray power using a standard line focus Cu XRD x-ray tube.

• System must have a single position sample spinner.

• The system will include 2 zero background holders with a 5mm x 0.2mm deep well for use with the rotation stage.

• System must include a removable bulk sample stage with variable Z to allow large samples up to 5” x 6.” This stage will be swappable with all other sample stages.

• The system must have a continuously variable divergence slit that keeps the irradiated area of the sample constant throughout the entire 2-theta measurement range.

• The system must come standard with a high-speed silicon strip detector.

• The system must have a continuously variable knife edge to provide low angle protection of the detector and open automatically as the detector is moved to higher 2-theta ranges.

Instrument Operation and Data Software

• System must be equipped with a user upgradable stand-alone external PC running

Windows 10 or 11 64-bit O/S that can be easily and inexpensively upgraded by the user in the future to new PC hardware and/or to a new O/S.

• Software to include data collection, basic analysis, search/match package, a standardless quantitative analysis package using whole pattern fitting.

• The ICDD Axiom database should be included.

3. Place of Performance Ames Research Center in the Code TSM Lab Space in Moffett Field, California.

4. Period of Performance

• The lead time for delivery of this unit is 4-5 months, not including installation.

Installation will include a full onsite installation and 3 days of web-based training.