16_2404_SSJ_Code2525_REDACTED-RFQ.pdf

Request for Quotation

Model 32 Test Instrument

BACKGROUND:

The NAVSEA Miniature Microminiature (2M)/Module Test and Repair (MTR) Program objectives are to enhance unit readiness and reduce expenditures related to the repair and maintenance of weapon systems across the

Department of Defense and Homeland Security. The required test instruments (Model 32) will support life cycle sustainment of the 2M/MTR Program. The NAVSEA sponsored 2M/MTR Program is a CNO N43 resourced

Program of Record. The Naval Undersea Warfare Center Detachment, Field Engineering Office Norfolk

(NAVUNSEAWARCEN DET NORFOLK), Code 2525 has been assigned by COMNAVSEASYSCOM 04RM33 as

In-Service Engineering Agent (ISEA) responsible for the Test Measuring & Diagnostic Equipment assessment, deployment and life cycle support.

Since 1989, the NAVSEA 2M/MTR Program has been utilizing Huntron Analog Signature Analysis (ASA) Test

Equipment. The 2M/MTR Program’s testing and repair capabilities are located on nearly all Navy afloat vessels, Ashore maintenance activities Trident SSGN/SSBNs, Navy Aviation Maintenance depots, and Marine Corps

Ground maintenance echelons. In order to maintain life cycle sustainment of previously developed Huntron Test

Routines using the Protrack/Scanner located at 2M/MTR repair work centers across the Department of Defense and

Homeland Security, fleet migration to the Model 32 is required. The currently fielded Huntron Protrack/Scanner test instrument is obsolete and the replacement is the Huntron Model 32. The Government’s minimum salient characteristics provide comparable technical engineering and assurance that the Module Test and Repair Diagnostic

Routines are transportable between both test instruments. Conversion and reutilization of the test routines is the paramount economic consideration related to the acquisition requirement. ISEA evaluation of the Huntron Test

Instruments validated 100% operational compliance using converted Huntron Test Routines.

REQUIREMENT:

The below minimum characteristics are critical in assuring stable operation and complete system compatibility. The

Protrack/Scanner replacement, Model 32, migration path is dependent upon technical characteristics meeting the following minimum requirements:

Item Salient Characteristic Protrack/Scanner Model 32

A Open Circuit Voltage 24 selections of peak voltage

(200/400/600/800mV/1V through 20V in 1V steps) Yes Yes

B Source Resistance 16 selections of resistance

(10/20/50/100/200/500/1,000/2,000/5,000/10,000/20,000/50,000/

100,000/54/1,200/26,700 Ohms) Yes Yes

C Short circuit current is source voltage divided by source resistance shall not exceed 200mApk (200 milli amperes peak) maximum Yes Yes

D Frequency 40 selections of frequency (20 through 190 in 10Hz steps, 200 through 1,900Hz in 100Hz steps, 1,000Hz through

5,000Hz in 1,000Hz steps) Yes Yes

E The test channel shall be multiplexed supporting display modes for Channel A, Channel B, Channels A and B, Dual Channels

A+B.

Yes Yes

F The multiplexed channels shall have automatic overvoltage current limited lockout safety protection. Yes Yes

G Pulse generator shall have zero to ten volts direct current (Vdc), 2 percent to fifty percent duty cycle, source resistance no greater than 100 Ohms, short circuit current no greater than 100mA.

Yes Yes

H Test Instrument shall possess benchtop control using default range settings, contrast, channel A and B signature separation. Display refresh rate shall be greater than or equal to 60Hz.

Yes, Display type

CRT

Yes, Display type LCD

I Test Instrument power requirements shall operate using 90 to 250

Vac, frequency range between 47 to 63 Hz, and power consumption shall not exceed 35 Watts.

Yes Yes

J Test channels shall be capable of 128 test and common pins. Each connection port shall support 64 pins. Channel A and B must be able to be multiplexed together to supporting 128 pin count.

Yes Yes

K The test instrument must provide 100% compatibility and test result transportability using the previously developed Huntron Test

Routines.

Yes Yes

L The tester must be programmable to allow the technician to set voltage, resistance, and frequency for the specific component under test.

Yes Yes

M The tester and control application must also prevent any damage to components under test by automatically prohibiting setting the test parameters beyond the current limit of the device under test.

Yes Yes

N The tester must be able to digitize the resultant voltage and current signatures and store them on a Windows compatible controller using software provided with the tester.

Yes Yes

The NAVSEA 2M/MTR Program has been utilizing Huntron Analog Signature Analysis (ASA) Test Equipment since 1989. Since that time approximately 7,000 Test Routines have been developed using Huntron hardware and proprietary software. Due to hardware obsolescence and evolving technology the need exists to transition to a next generation tester. It is imperative that any future test instrument be 100% backward compatible with the current test routine library and currently deployed hardware configuration. Test routines developed on a replacement tester must be backward compatible with the hardware configuration currently deployed. Previously developed test routines must operate and produce 100% compatible test results on the replacement test instrument.