Revised_Specifications_for_PR_68-1083-19.pdf

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Ultrafast Laser System for SEE Laser Testing Federal contract opportunity
Solicitation number
N00173-20-R-TL01
Issued by
Department of the Navy Secretary of the Navy Office of Naval Research

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SPECIFICATIONS FOR ULTRAFAST LASER SYSTEM

BROAD DESCRIPTION:

The Naval Research Laboratory (NRL) has a requirement for a commercially available ultrafast laser system that will be used for Single Event Effects (SEE) laser testing. Pulsed laser SEE testing will be done on silicon and silicon germanium based integrated circuits and wide bandgap materials such GaN, AlGaN and Ga2O3. For these type of experiments, we need to use a laser system that will consist of high repetition rate ultrafast diode-pumped laser amplifier and an optical parametric amplifier that is wavelength tunable from UV to the near Infrared.

SPECIFICATIONS:

1) DIODE-PUMPED FEMTOSECOND LASER

• Center Wavelength (nm): between 1020 – 1040 nm

• Laser Repetition Rate Control: tunable from Single shot to at least 20 MHz 1

• Laser output pulse energy: maintain >20 microjoules for repetition rates from single shot to at least 1MHz

• Laser output pulse width: < 350 fs

• Laser output spatial mode quality: mode is TEM00, M2 <1.2, beam divergence < 1mrad

• Beam Pointing stability: < 25 microradians/deg C

• Long-term Pointing Stability: at Fixed Rep-rate ±25 microradians over 8 hours

• Pulse-to-pulse Energy Stability: <2% (RMS)

• Single box configuration

2) OPTICAL PARAMETRIC AMPLIFIER

• Compatible with 1020-1040 nm pumping from diode-pumped femtosecond laser

• Computer controlled wavelength tuning

• Output Wavelength: tunable from <350nm to >2000 nanometers

• Output Pulsewidth: < 300 femtoseconds

• Output Repetition rate: tunable from single-shot to 1MHz 2

• Output pulse energies at repetition rate of 1MHz 2,3

>100 nanojoules at 350nm wavelength >100 nanojoules at 630nm wavelength >200 nanojoules at 1260nm wavelength

1This laser will be used not only to pump Optical Parametric Amplifier but also for photon counting. In order to avoid photon pile-up in our photon detector, count rates must be at least 20x lower than the laser repetition rate. This experiment can tolerate a minimum count rate of 1MHz.

We therefore require a laser with minimum repetition rate of 20MHz.

2SEE work on SiGe and GaN based circuits will be performed at repetition rates up to 1MHz.

3These specified pulse energies are minimum requirements for our SEE experiments.

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