19QGM68_0001.pdf

AMENDMENT OF SOLICITATION/MODIFICATION OF CONTRACT

Except as provided herein, all terms and conditions of the document referenced in Item 9A or 10A, as heretofore changed, remains unchanged and in full force and effect.

15A. NAME AND TITLE OF SIGNER (Type or print)

30-105-04EXCEPTION TO SF 30

APPROVED BY OIRM 11-84

STANDARD FORM 30 (Rev. 10-83) Prescribed by GSA

FAR (48 CFR) 53.243

The purpose of this amendment is to update the Energy Dispersive Spectroscopy (EDS) System detector size and associated requirements w ithin the specifications. See Summary of Changes for the updated specification.

1. CONTRACT ID CODE PAGE OF PAGES

J 1 5

16A. NAME AND TITLE OF CONTRACTING OFFICER (Type or print)

16C. DATE SIGNED

BY 06-Mar-2019

16B. UNITED STATES OF AMERICA15C. DATE SIGNED15B. CONTRACTOR/OFFEROR

(Signature of Contracting Officer)(Signature of person authorized to sign)

8. NAME AND ADDRESS OF CONTRACTOR (No., Street, County, State and Zip Code) X N0016419QGM68

X 9B. DATED (SEE ITEM 11)

26-Feb-2019

10B. DATED (SEE ITEM 13)

9A. AMENDMENT OF SOLICITATION NO.

11. THIS ITEM ONLY APPLIES TO AMENDMENTS OF SOLICITATIONS

X The above numbered solicitation is amended as set forth in Item 14. The hour and date specified for receipt of Offer is extended, X is not extended.

Offer must acknowledge receipt of this amendment prior to the hour and date specified in the solicitation or as amended by one of the following methods:

(a) By completing Items 8 and 15, and returning 1 copies of the amendment; (b) By acknowledging receipt of this amendment on each copy of the offer submitted;

or (c) By separate letter or telegram which includes a reference to the solicitation and amendment numbers. FAILURE OF YOUR ACKNOWLEDGMENT TO BE RECEIVED AT THE PLACE DESIGNATED FOR THE RECEIPT OF OFFERS PRIOR TO THE HOUR AND DATE SPECIFIED MAY RESULT IN

REJECTION OF YOUR OFFER. If by virtue of this amendment you desire to change an offer already submitted, such change may be made by telegram or letter, provided each telegram or letter makes reference to the solicitation and this amendment, and is received prior to the opening hour and date specified.

12. ACCOUNTING AND APPROPRIATION DATA (If required)

13. THIS ITEM APPLIES ONLY TO MODIFICATIONS OF CONTRACTS/ORDERS.

IT MODIFIES THE CONTRACT/ORDER NO. AS DESCRIBED IN ITEM 14.

A. THIS CHANGE ORDER IS ISSUED PURSUANT TO: (Specify authority) THE CHANGES SET FORTH IN ITEM 14 ARE MADE IN THE

CONTRACT ORDER NO. IN ITEM 10A.

B. THE ABOVE NUMBERED CONTRACT/ORDER IS MODIFIED TO REFLECT THE ADMINISTRATIVE CHANGES (such as changes in paying office, appropriation date, etc.) SET FORTH IN ITEM 14, PURSUANT TO THE AUTHORITY OF FAR 43.103(B).

C. THIS SUPPLEMENTAL AGREEMENT IS ENTERED INTO PURSUANT TO AUTHORITY OF:

D. OTHER (Specify type of modification and authority)

E. IMPORTANT: Contractor is not, is required to sign this document and return copies to the issuing office.

14. DESCRIPTION OF AMENDMENT/MODIFICATION (Organized by UCF section headings, including solicitation/contract subject matter where feasible.)

10A. MOD. OF CONTRACT/ORDER NO.

2. AMENDMENT/MODIFICATION NO. 5. PROJECT NO.(If applicable)

6. ISSUED BY

3. EFFECTIVE DATE

06-Mar-2019

CODE

NAVAL SURFACE WARFARE CENTER CRANE DIV

D. DEVIDO (812-854-2894)

BLDG 3373

300 HWY 361

CRANE IN 47522-5001

N00164 7. ADMINISTERED BY (If other than item 6)

4. REQUISITION/PURCHASE REQ. NO.

CODE

See Item 6

FACILITY CODECODE

EMAIL:TEL:

N0016419QGM68

SECTION SF 30 BLOCK 14 CONTINUATION PAGE

SUMMARY OF CHANGES

SECTION 1.0 - SCHEDULE/INSPECTION & ACCEPTANCE/DELIVERY

The following have been modified:

SPECIFICATIONS

SPECIFICATIONS FOR A VARIABLE PRESSURE FIELD EMISSION SCANNING ELECTRON

MICROSCOPE WITH ACCESORIES

The Naval Surface Warfare Center Crane (NSWC Crane) has a requirement for a Variable Pressure Field Emission Scanning Electron Microscope (VP FE-SEM). (Also known as a Low Vacuum FE-SEM.) The VP FE-SEM will consist of the following components and will meet or exceed the following minimum requirements.

Variable Pressure Field Emission Scanning Electron Microscope (VP FE-SEM)

1. General

a) The VP FE-SEM shall be capable of attaining a 1KV 20X (or lower) image free of any beam distortion or column or aperture cropping. The image must be acquired in the high vacuum mode of operation using the lower secondary electron detector.

b) An Energy Dispersive X-Ray Microanalysis (EDS) system shall be included.

c) The contractor shall quote 3D Mapping software for Scanning Electron Microscopes (SEM). (Such as Digital Surf’s Mountain Map for SEM) The 3D Mapping must be of a standard level, and must include the ability to do grain/particle analysis. Software must be able to map an SEM image to determine step heights of .1uM or less.

d) A plasma or UV cleaning system for the VP FESEM chamber shall be included.

2. VP FE-SEM Electron Optics

a) The VP FESEM shall have a Schottky (thermal) Field Emission electron beam source.

b) The maximum Probe Current attainable with this system shall be 200nA or better.

c) Analytical working distance will be no less than 5 mm.

d) The electron column shall have a manufacture published minimum image resolution of 0.8nm (nano-meter) or better at 15kV (Kilo-volt) and 1.2nm or better at 1kV. The resolutions shall be demonstrated before acceptance at installation.

(Vendor can choose method of resolution measurement.)

e) The system must have a 60-degree conical final lens or better.

f) No sleeve/aperture shall be required to be manually installed by the operator before VP mode operation can occur. The VP mode must be an automatic operation.

3. Chamber & Stage

a) The chamber must have an Air Lock or Intro Chamber attached to it so samples can be inserted without breaking chamber vacuum.

b) A retractable Faraday Cup shall be included.

c) At minimum a joystick shall be included for stage movement. If available a trackball/joystick combination stage control unit shall be included.

d) A mount to hold four mounting stubs shall be included.

e) The specimen chamber shall be equipped with an infrared video chamber camera to allow continuous monitoring of SEM chamber via one of the SEM's displays.

f) The stage must be a 5-axis motorized eucentric. Stage must be able to tilt and rotate at a fixed point and keep the image centered and in focus.

g) Chamber must be able to accommodate at a minimum two EDS detectors 180 degrees apart.

h) Stage movement shall be at minimum: X= 130mm, Y= 90mm, Z= 35mm, T= -3to +70 degrees, and

R= 360 degrees, or better.

i) Stage bias for any Beam Deceleration shall be included and be able to be turned off by operator.

4. Vacuum System

a) The vacuum system shall include a turbo molecular pump backed by a dry pumping system for a contamination free vacuum system. There shall be an ion getter pump for ultra-high vacuum in the emitter region and column.

b) Vacuum range for low vacuum mode shall be 10-300Pa or better.

c) The time to achieve an operating vacuum after a specimen exchange that requires opening the specimen chamber shall not exceed 5 minutes.

d) Interlocks shall be incorporated to provide fail-safe protection of the equipment in the event of a loss of electrical power, coolant, primary vacuum, or secondary vacuum.

e) If a water cooling system is needed by the VP FE-SEM vendor it must be an air cooled type.

5. Detectors

a) An in-lens secondary electron detector has to be integrated into the column design.

b) An in-lens backscatter electron detector shall be included and integrated into the column design.

c) A lateral Everhart-Thornley SE-detector mounted at the specimen chamber has to be provided.

d) Any special Variable Pressure imaging detectors shall be included.

e) A retractable 4 Quadrant, at minimum, Si Backscattered Electron Detector shall be included.

f) Mixing of different signals must be possible at any ratio.

6. Scan Controls& Display

a) The system shall have full frame scan, reduced area scan, line scan profile, split screen, and spot mode.

b) The system shall have dual image display.

c) Tilt Compensation with variable amplitude and any possible advanced Tilt Compensation features shall be provided.

d) The system shall be capable of digital image capture, store, and display. As a minimum, image file save format types shall include BMP, TIFF, and JPEG.

e) The system shall have data display of accelerating voltage, magnification, WD, stage positions and other pertinent information.

f) It must be possible to enter data from the SEM system keyboard anywhere on the displayed image.

g) The system must have image capturing and stitching capability to stitch several images together to cover a larger area.

h) The system shall have an external scan interface to allow direct control of the SEM column scan coils by a remote digital scan generator such as that furnished with an EDS system for elemental and mapping/linescan analysis.

i) The system shall be capable of making point-to-point measurements on the displayed digital image.

j) Measurements orientation capability shall be at all angles, with angle value input automatic or manual.

k) The system shall be controlled by a keypad, mouse, and joystick located on the main console.

l) The system will be configured with a Control Panel with dedicated knobs for at least these functions:

brightness, contrast, magnification, focusing and astigmatism.

7. Energy Dispersive Spectroscopy (EDS) System

a) The contractor will provide an EDS system from a separate manufacturer to attach to the VP FE-

SEM.

b) The system shall have an Advanced package capable of image display, X-ray mapping, linescan analysis, standardless, standards quantitative chemical analysis, functionality for acquiring overlap and background corrected X-ray maps and linescans in real-time, functionality that automatically turns information contained in a set of X-ray maps into a single image to visualize both phase and Chemical variation in a specimen and unique reactive and predictive specimen drift correction functionality.

c) Must include the ability to do large area mapping.

d) Image display on the EDS system monitor shall have equivalent quality and resolution as required for the VP FE-SEM display. The spectral imaging capability shall collect and store spectral information at every beam scan point.

e) If the EDS software is to be installed on a separate computer.

f) Thin Film or Layers Analysis feature for the EDS system-if available.

g) The separate computer supplied for the EDS will meet the requirements of section 8 below.

h) The VP FE-SEM system mouse and keyboard will be able to control the EDS system.

i) Detector Resolution: The FWHM resolution for a Mn Kα peak shall be no greater than 125 eV.

The FWHM resolution for a C Kα peak shall be no greater than 50 eV.

j) Detector: The detector will be the SDD type with a size of at least 100 mm2.

8. PC minimum requirements

a) The VP-FESEM computer:

1) The computer connected to this VP FE-SEM must be high grade PC with Windows 10 operating system. If Windows 10 is not available Windows 7 is acceptable only if Window 10 will be provided in the future with a free upgrade.

2) Will be supplied with two monitors at least 27 inch minimum in size.

3) Will have the latest version of Microsoft Office Professional.

4) Will have at least one DVD/RW drive.

5) Will have an internal archive hard drive of at least 5Tb.

6) Will have latest version of vendor’s software.

b) The EDS computer:

1) The computer connected to this VP FE-SEM must be high grade PC with Windows 10 operating system. If Windows 10 is not available Windows 7 is acceptable only if Window 10 will be provided in the future with a free upgrade.

2) Will be supplied with one monitor at least 27 inch minimum in size.

3) Will have the latest version of Microsoft Office Professional.

4) Will have at least one DVD/RW drive.

5) Will have an internal archive hard drive of at least 5Tb

6) Will have latest version of vendor’s software.

c) An Ergotech type monitor stand shall be provided to hold all three monitors.

9. Warranty

a) The VP FE-SEM shall be covered by the manufacturer's standard commercial warranty.

10. Support

a) After VP FE-SEM installation the contractor will be able to provide high quality and proven support for maintenance and applications during normal working hours of M-F 8:00 am to 5:00 PM.

b) The contractor will include in any maintenance agreements phone support within 4 hours and on-site support within 48 hours.

c) The contractor will include in any maintenance agreements a minimum of 1 preventive maintenance (PM) visit per year.

d) The contractor will include in any maintenance agreements unlimited emergency repair visits per year.

e) The contractor will include in any maintenance agreements free replacement of all non-consumable parts.

f) The contractor will not include in any maintenance agreements replacement of consumable parts.

g) The Support Engineer that comes on-site will need to be a U.S. Citizen and have a clean background.

11. Training, Manuals, Tools, Etc.

a) After installation a minimum of 1 day of user training shall be provided.

b) A minimum of 2 days of hands-on operational training 3 to 6 months after installation shall be provided.

c) Vendor must supply any training materials.

d) The manufacturer shall provide user's manuals for the VP FE-SEM system.

e) A standard tool kit for the VP FE-SEM will be provided.

12. Options

The following options shall be available. The options shall be quoted as separate line items.

a) A second EDS detector:

Detector Resolution: The FWHM resolution for a Mn Kα peak shall be no greater than 125 eV. The FWHM resolution for a C Kα peak shall be no greater than 50 eV.

Detector: The detector will be the SDD type with a size of at least 100 mm2.

(End of Summary of Changes)