FA9101-22-Q-B007- Sources Sought-Signed.pdf

18 February 2022

MEMORANDUM FOR VENDORS REGISTERED UNDER NAICS CODE 334516 –

ANALYTICAL LABORATORY INSTRUMENT MANUFACTURING

FROM: AFTC/PZI (Arnold)

Attn: Greggory C. Jones

100 Kindel Drive Suite A332

Arnold AFB TN 37389-1332

SUBJECT: FA9101-22-Q-B007 – Scanning Electron Microscope: Hitachi SU3900 or Equal -

Market Research / Sources Sought

1. Disclaimer

THIS SOURCES SOUGHT IS FOR INFORMATIONAL PURPOSES ONLY. THIS IS NOT A

REQUEST FOR QUOTATION/PROPOSAL (RFQ/RFP). THIS SOURCES SOUGHT DOES

NOT CONSTITUTE A SOLICITATION AND SHALL NOT BE CONSTRUED AS A

COMMITMENT BY THE GOVERNMENT. RESPONSES IN ANY FORM ARE NOT

OFFERS AND THE GOVERNMENT IS UNDER NO OBLIGATION TO AWARD A

CONTRACT AS A RESULT OF THIS ANNOUNCEMENT. NO FUNDS ARE AVAILABLE

TO PAY FOR PREPARATION OF RESPONSES TO THIS ANNOUNCEMENT. ANY

INFORMATION SUBMITTED BY RESPONDENTS TO THIS TECHNICAL DESCRIPTION

IS STRICTLY VOLUNTARY. THIS NOTICE SEEKS INFORMATION ON COMMERCIAL

OFF THE SHELF ITEMS

2. Introduction

This Sources Sought is a request to gain more information to see what vendor has the ability to provide a Hitachi SU 3900 Large Chamber Variable-Pressure Scanning Electron Microscope or equivalent that meets the specifications noted in Section 4 – Required Capabilities and

Specifications.

The result of this market research will contribute to determining the method of procurement, if a requirement materializes. Based on the responses in regards to this Sources Sought notice / market research, the requirement may result in a single source acquisition, may be set-aside for small businesses (in full or in part), or may be procured through full and open competition.

Telephone inquiries will not be accepted or acknowledged, and feedback or evaluations may or may not be provided to companies regarding submissions.

DEPARTMENT OF THE AIR FORCE

HEADQUARTERS AIR FORCE TEST CENTER

(AFMC)

EDWARDS AIR FORCE BASE CALIFORNIA

3. Program Background

This procurement is to replace/upgrade our current Hitachi S-3000N scanning electron microscope. This unit is used for failure analysis, metallography, and material analysis for a range of applications. Primary features needed include a large variable low-pressure vacuum chamber, high resolution at low voltages in both high and low vacuum, 3D topographical imaging, and easy to clean design.

4. Required Capabilities and Specifications

Hitachi SU3900 Large Chamber Variable-Pressure Scanning Electron Microscope or Equivalent

Specifications:

- Must be able to operate at acceleration voltages between 0.3kV and 30kV at increments of 100V or less

- Chamber accommodates a specimen 300mm in diameter and 130mm in height with specimens 200mm in diameter fully addressable

- Guaranteed secondary electron resolution of 3.0nm at 30kV and 15.0nm at 1kV

- Guaranteed backscattered electron detector resolution of 4.0nm at 30kV

- 5-Axis eucentric computer controlled motorized stage o X/Y transverse: 150mm x 150mm and a tilt: -20° to 90° o Stage mounted on door with rails (no hinges) o Soft limits to prevent specimen and chamber collision o Stage must be rated for sample weighing up to 5kg o Includes stage lock

- Secondary Electron Detector

- Backscatter Electron Detector o Solid state type detector with 5 or more segments o Positive and negative polarity independently for each segment o 3D imaging mode including 3 gain settings for adjusting shadowing o Must operate at a working distance of 4.5mm o Provides a clear image at true TV scan rates.

o Must be able to be retracted and inserted while HV is ON.

- Hitachi Ultra Variable-Pressure Detector (UVD) or equivalent o Capable of detailed surface imaging at low acceleration voltages in both high and low pressure modes o Provides compositional contrast at higher acceleration voltages o Operates as a broad range cathodoluminescence detector.

o Biasing must be adjustable by 100 or more steps through the GUI

- Chamber scope with GUI display to monitor specimen change

- Low vacuum capability o Operates from 6Pa to 650Pa with 26 or more selectable steps o Controlled from GUI using fully automatic pneumatic valves

- Equipped with live real-time specimen current display for x-ray analysis. Must directly measure the current through the stage and not approximate the current measurement.

- Gamma correction and tone curve adjustment for live and captured images

- Includes an “Auto Start” function that executes electron beam irradiation, bias setting, adjustment of focus, and brightness and contrast at the selected accelerating voltage

- In-chamber digital camera for navigating across a sample’s surface and with the ability to stitch multiple camera images for large samples

- Hitachi Multi ZigZag or equivalent that allows for up to 40,000 images to be and montages to be automatically acquired.

- Include Hitachi Intelligent Filament Technology (IFT) or equivalent technology allowing for increased filament life

- Record and monitor the total electron beam on-time for each filament, and approximate the remaining life of the filament.

- Includes a column liner for easy cleaning and replacing of apertures.

- Does not require a water recirculation system.

- Requires less than 1.5kVA of power consumption

- Equipped with 4 high angle take-off ports for EDS/WDS that focus at 35° and a working distance of 10mm and 2 ports under 2 of the EDS ports for EBSD.

- Compatible with Oxford Ultim Max 65 EDS Detector

- Maximum dimensions: 780mm (W) × 1,060mm (D) × 1,620mm (H)

- Installation, Calibration, and Warranty o Complete on-site installation of SEM and accessory hardware o 1 year full warranty with optional service warranty afterwards

5. Eligibility

The applicable NAICS code for this requirement is 334516 – Analytical Laboratory Instrument

Manufacturing, with a Small Business Size Standard of 1,000 Employees. The Product Service

Codes (PSC) is 6630.

6. Submission Details

Interested businesses should submit a brief capabilities statement package demonstrating their ability to provide a product that meets the specifications listed in Section 4 – Required

Capabilities and Specifications. If your company has the ability to provide a product that meets the required specifications, please provide the following information:

1) The organization’s name, address, primary point(s) of contact email address(es) & telephone number(s), website address, Cage Code, DUNS # and business size (small or large).

2) A tailored capability statements addressing the specifications of this notice with sufficient documentation supporting the vendor’s claim on their ability to provide a technically acceptable product.

a. If the vendor submits substitute specifications or an “or equal” solution, the vendor must provide sufficient technical details for AEDC to determine if the substitute specifications will meet the Government’s need.

3) Provide the expected lead-time for the product.

4) Provide budgetary pricing to support the vendor’s claim.

5) The submission should outline the vendor’s available contract vehicle(s) to obtain the product: GSA (provide schedule), Open Market (SAM.gov), etc.

The vendor’s response to this Sources Sought shall be electronically submitted to the Contracting

Officer, Greggory C. Jones:

- Email: greggory.jones.4@us.af.mil o Email Subject Line Reference: FA9101-22-Q-B0007 – Scanning Electron

Microscope: Hitachi SU3900 or Equal

- Response Date: 7 March 2022, 12:00 PM Central Standard Time

- DO NOT SUBMIT CLASSIFIED MATERIAL.

- All data received in response to this Sources Sought that is marked or designated as corporate or proprietary will be fully protected from release outside the Government and technical team.

Attachments:

- N/A

GREGGORY C. JONES

Contracting Officer mailto:greggory.jones.4@us.af.mil