FA8601-16-T-0025_Brand_Name_or_Equal_for_AFM.docx

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Attached to
Atomic Force Microscope Federal contract opportunity
Solicitation number
FA8601-16-T-0025
Issued by
Department of the Air Force Materiel Command Lifecycle Management Center Wright Patterson Air Force Base

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FA8601-16-T-0025 Brand Name or Equal Specification Requirements

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FA8601-16-T-0025_AFM_STATEMENT_OF_WORK_25_Apr_16.docx DOCX document
FA8601-16-T-0025_Provisions_and_Clauses_2.doc DOC document

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Attachment 2

SPECIFICATION REQUIREMENTS

Bruker Nano Atomic Force Microscope Model ICON3-SYS or Equal

Requirements for Atomic Force Microscope must meet these specifications:

A. Microscope (Basic Requirements)

1. The scan length in the X-Y direction should be no less than 85-micron meter.

2. Z range is no less than 9.0μm.

3. Vertical noise floor is smaller than 30pm RMS for a typical imaging bandwidth (up to 625Hz)

4. X-Y position noise (closed-loop) is not larger than 0.15nm RMS for a typical imaging bandwidth (up to 625Hz)

5. X-Y position noise (open-loop) is not larger than 0.10nm RMS.

6. Z sensor noise level (closed-loop) is not larger than 35pm RMS for a typical imaging bandwidth (up to 625Hz); not larger than 50pm RMS for force curve bandwidth (0.1Hz to 5kHz)

7. Integral nonlinearity (X-Y-Z) is not larger than 0.5%.

8. The noise levels of the position sensors should be within the sub-angstroms range in the Z-axis, and angstroms in the X-Y axis.

9. Drift rates should be less than 200pm per minute.

10. The AFM controller should allow simultaneous high-speed data capture and high- pixel-density imaging (> 5000 x 5000 data points in the X-Y directions) in no less than eight channels.

11. The AFM should be able to quantitatively measure nanomechanical properties while simultaneously imaging sample topography at high resolution.

12. The motorized position stage of the AFM should be able to mount large samples that are up to 210mm in diameter and 15mm in thickness.

13. High resolution inspection of the samples using optical microscopy is required. The inspectable area of the samples should be no less than 180mm × 150mm with better than 2μm unidirectional repeatability and 3μm bidirectional repeatability. The optical microscope images can be recorded using a digital camera with digital zoom and motorized focus.

14. High speed graphical user interface.

15. Voltage requirement: single phase 100-120V at 50-60 Hz

16. Computer for the AFM Control, data acquisition, and storage with one LCD monitor (30-inch LCD monitor, 2560x1600, 50/60 Hz refresh rate, auto switching).

17. Must fit inside of glove box specified below.

B. RECIPES AND SOFTWAREW AUTOMATED OPERATION

a. Allows users to easily automate many aspects of the AFM software by creating recipes through an easy to use graphical user interface.

b. Provides access to real-time and offline features of AFM software, resulting in improved productivity and consistency of results by allowing automation of imaging for multiple sites on a single sample, imaging the same sites on multiple similar samples, imaging multiple (different) types of measurements on the same sample, creating a paneled mosaic of images, performing complex combinations of offline analysis on batches of images and creating detailed custom reports of any automated process created by user.

C. PeakForce TUNA Module for Conductive AFM and Tunneling AFM measurement Equivalent

a. A method for probing / measuring conductivity of fragile samples such as organic photovoltaic, conductive nanotubes, and nanoparticles.

b. Provides direct, precise force control and eliminates lateral forces enabling high sensitivity and high-resolution current imaging.

D. PeakForce QNM Software Equivalent

a. Allows quantitative mapping of nano-mechanical properties including elastic modulus, adhesion, deformation, and dissipation while simultaneously imaging sample topography at high resolution.

b. Be able to control the force used to indent the sample to a few nanometers to maintain both resolution and prevent sample damage.

E. Glove box

a. Custom glove box that enables high resolution AFM performance while in an atmosphere of <1ppm Oxygen and <1ppm H2O

b. Based on the Lab master series 2-glove version with approximate inside dimensions of 1250 mm (w) x 780mm (d) x 900mm (h), standard 390/600mm antechamber, and mini 150/400mm antechamber.

c. Modification of mini antechamber for integration of a 260 liter per second Turbo-molecular pump with a Rotary vane pump included. The rotary pump must include an oil mist filter, gas ballast, oil return kit and fore-line trap.

d. Touch panel controlled regenerable gas purification system with oxygen and water analyzers.

e. Glove box pre-mounted onto custom-designed rigid stand with thick steel top plate and vibration dampening.

f. The glove box and stand dimensions cannot be larger than 88 inches long by 43 inches wide by 75 inches high. If dimensions are larger the instrument will not fit through the doorway.

F. Installation and training to be included at AFIT for up to 4 people.

G. All components and modifications must be warranted by the manufacturer for one year from date of installation.

H. All manufacturers of AFM’s will be evaluated using the above mentions requirements / specifications. If more than one manufacturer is found they will be given equal opportunity to supply an instrument.

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