Attachment_1_-_Minimum_Specifications.pdf
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- Attached to
- BLM - NML Spectrometer Federal contract opportunity
- Solicitation number
- 140L1722R0011
About this file
This solicitation requests proposals for the supply, delivery, installation, training and technical support of a Rigaku ZSX Primus IV Sequential Wavelength-Dispersive XRF Spectrometer or equivalent to replace an aging spectrometer for the Bureau of Land Management's National Minerals Laboratory. Responsive proposals must include a filled and signed SF1449 with any applicable discounts for an offered trade-in of the existing Primus II spectrometer, as well as a technical response demonstrating how the offered machine is equivalent to the Rigaku Primus IV and meets the minimum requirements detailed in Attachment 1. Proposals are due by the contracting officer Robert Hall by the specified date. Award will be made to the low price technically acceptable offer based on commercial item procedures.
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|---|---|---|
| Sol_140L1722R0011.pdf | ||
| Attachment_2_-_Trade-In_Specs.pdf |
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Attachment 1 – Minimum Specifications
• Rigaku Primus 4 (or equivalent)
• Tube above orientation
• 30µm thick x-ray tube window
• 10 analyzer crystals and a 10-crystal exchanger
• Automatic change of crystals via the data gathering software.
• Must have the following crystals:
▪ LiF200 (Ti-U)
▪ PET Crystal (high sensitivity Al-Ti analysis) (curved)
▪ Ge Crystal (P-Ca analysis) (curved)
▪ RX-25 crystal (O, F, Na, Mg analysis)
▪ LiF220 (higher resolution than the LiF200 for Cr-U analysis)
▪ PET Crystal High Sensitive Type
▪ RX-35 crystal High sensitivity crystal (O, F, Na, Mg analysis)
▪ RX45 crystal (O & N analysis)
▪ RX61F crystal (C analysis)
▪ RX75 crystal (B analysis)
• Alternates – please explain why these are better or have replaced one of these following:
▪ RX4 crystal (Si analysis)
▪ LiF420 (analysis of Zn-U)
• Automatically Controlled Dual vacuum pumps to amplify the intensity of signal of elements. One pump is to control the vacuum in the analysis chamber, one for control of the vacuum in the pre-evacuation chamber.
• The analysis chamber must have Automatic Pressure Control (APC) for superior light element analysis stability. The pre-evacuation chamber must allow adjustable rate of vacuum increase to allow glass beads and metal samples to be evacuated quickly while allowing a slow vacuum increase to reduce the vacuum shock on pressed pellets to reduce incidence of pellets breaking.
• Dust trap to collect debris if breakage does occur before it can enter the vacuum pumps.
• The spectrometer chamber must always operate under vacuum, even when running under Helium atmosphere.
• Chamber temperature should be 36°C or above and not require the use of refrigerants.
• Heat Exchanger
• Heating circuits with independent power supply so that chamber is held at correct temperature, even when the system is shut down. This allows rapid turn-on and operation without the need for lengthy temperature stabilization.
• Signal attenuator to ensure that the detector is always operating in its linear range and will not overload. This removes the need to keep changing the tube current.
• Flow Proportional Counter (FPC) shall have a computer controlled center wire cleaning function. This increases up-time and reduces the need to change the center wire due to contamination from the quenching gas (P10).
• Mapping option. Must utilize r-Ө stage – the beam must stay stationary at the point of highest intensity and the sample is moved in the x-and-y directions. The mapping must be
WDXRF to take advantage of the superior resolution and sensitivity that the technique offers.
• Advanced software features to include the following o Automatic Quantitative Application Setup. Operator just inputs sample information and analysis components and elements. The software automatically sets the best lines, peak and background angles, overlap corrections and matrix corrections by the use of SQX and its calibration standards.
o EZ Scan (or its equivalent) – the ability to run a semi-quantitative program by specifying simple sample parameters, with all measurement parameters automatically selected.
o Material identification function – the ability to set up a library of materials and have the system analyze an unknown and then identify it. This is a huge workflow assist.
o Fixed Precision Measurement. The ability to tell the system to analyze to a required precision and then move to the next element. Optimizes results and sample running time.
o Automatic spectrum identification. In the light element range, high-order lines of heavy elements occasionally cause incorrect spectrum identification. The software must perform a qualitative analysis starting with heavy elements and reflect the information of heavy elements automatically to spectrum identification for the light elements to solve the above problem. In other words, it needs to perform this task automatically for us.
File details come from the government source that posted it. Updated .