A02 Sources Sought_Nano-Spectroscopic System_11 June 2020.pdf

THIS SOURCES SOUGHT IS BEING ISSUED FOR MARKET RESEARCH PURPOSES ONLY. This is not a solicitation. Responses to this notice are not considered as offers and cannot be accepted by the Government to form a binding contract. The Government will not be responsible for any costs incurred by interested parties responding to this Sources Sought notice. The intent of this notice is to identify businesses, especially small business (SB) concerns, certified 8(a), HUBZone, Service Disabled Veteran Owned Small Businesses (SDVOSB), and Women- Owned Small Business (WOSB) concerns capable of performing the requirements described below.

The US Combat Capabilities Development Command - Soldier Center (CCDC – SC), Soldier Protection and Survivability (SPSD) in Natick, MA is issuing a sources sought notice to identify potential sources to provide a Nanoscale Spectroscopic System. The requirements being sought can be found in the ‘REQUIREMENTS' section of this sources sought below.

1. Background:

A novel capability for nanoscale broadband infrared (IR) spectroscopy (NBIS) with Atomic Force Microscopy (AFM) and apertureless Scanning Near-field Optical Microscopy (s-SNOM) is needed to better understand and control smart materials that impact signature management, multi-functionality, and thermal management. These areas are critical for future Soldier needs and under increasing emphasis at CCDC- Soldier Center. In addition, there are no or poorly written requirements for these areas, which may result in wasted acquisition dollars spent because S&T and PM personnel don't understand well enough proposed new capabilities in the infrared regime and especially in the new areas of smart materials and e-textiles. This capability would give critical understanding and control of nano-infrared capabilities to the acquisition and technical workforce.

Traditional Fourier Transform InfraRed (FTIR) Spectroscopy FTIR involves the use of a broadband light source to illuminate a sample, with use of an interferometer to very accurately measure the different frequency (Fourier) components of the broadband infrared signal. Recently, based on exciting research results from academia, companies have begun to develop technology for measuring the infrared response of very small nanoscale regions on surfaces, which is important for understanding how material properties influence infrared functionality and properties. “AFM-IR” is a new technique where a sample is illuminated by a tunable broadband infrared laser, which excites the sample’s absorption resonances that occur at wavelengths within the laser excitation wavelength range. These infrared excitations heat the sample more efficiently than other wavelengths, and this manifests itself as an increased AFM signal at these resonant wavelengths, identifying them by their heightened response. Hence, this “AFM-IR” is a new nanoscale IR spectroscopic technique. “s-SNOM” is also a nanoscale IR spectroscopic technique, where apertureless SNOM measures the scattered and/or absorbed and/or reflected near-field light created by infrared excitation as a function of IR wavelength, to better understand important infrared functionalities and properties.

2. Requirements:

The Nanoscale IR spectroscopic-AFM-s-SNOM capability system must have:

a. Broadband infrared laser source to illuminate the sample, with wavelength range from 2.5 m to 15 m (2.5 to 15 micrometers) wavelength (670 to 4000cm-1), especially the important 800 cm-1 to 1850 cm-1

(5.4 to 12.5 m (micrometers)) sub-range. By extending the source’s range past 14 m (micrometers) and below 5 m (micrometers), it will be possible to excite certain polymer and nanostructure absorption and scattering resonances that are of interest. The broadband infrared laser source must have both pulsed and continuous wave (cw), or pulsed and quasi-continuous (quasi-cw), modes and enough power to heat the sample locally and enable both AFM measurement of thermal absorption resonances (in pulsed mode) and s-SNOM optical measurement of absorption and/or reflection and/or scattering resonances.

Both these measurement techniques must be possible to carry out from the same overall system. E.g., it is impractical to make these measurements using two separate sources and setups. Tunability of the broadband source is desired in the wavelength region for the AFM spectroscopy (AFM-IR). Note that modulation of visible light via a “photothermal effect” is not a desired technique.

b. Associated basic and advanced training to enhance understanding of smart materials and their analysis by acquisition personnel. Advanced training will be conducted after users have basic training and have time to use the system’s capability. There should be at least 2 or 3 days of initial installation and training, followed by a total of at least four days’ training to be scheduled later, upon return of the contractor to the government site at a mutually agreeable date. These four days should be split up into at least 2 different non-continuous sessions, in order to enable acquisition personnel to learn more about using this advanced capability on their own time, before the contractors’ return to provide more specialized training.

c. AFM capability for nanoscale imaging and spectroscopy (AFM-IR), including both tapping and contact modes, to measure thermal absorption resonances. The tapping or contact AFM response changes due to mechanical deformation from thermal expansion (or contraction) from resonant infrared (heat) absorption from the broadband infrared laser. The change in the AFM response should be measured using an a.c.

technique, a pulsed broadband laser with tuned output in a wide, 670 to 2000 cm-1 (5 to 15 m (micrometers) wavelength) range, and with the AFM in tapping mode. In the future, it is desirable to increase tunability to 4000 cm-1 (2.5 m (micrometers) wavelength), in order to characterize important chemical resonances around 3 m (micrometers) wavelength. Being upgradeable to this wider spectral range is of interest.

d. Apertureless s-SNOM optical capability for measurement of absorption and/or reflectivity and/or scattering resonances near the scanning AFM head, illuminating with a broadband IR laser source, in continuous wave (cw) or quasi-continuous (quasi-cw) mode, in the range of at least 670 cm-1 to 2000 cm-

1 (5 to 15 m (micrometers)). s-SNOM spectroscopic measurements to 4000 cm-1 (2.5 m (micrometers)) are desirable.

e. Appropriate electronic control including possible computer(s) with software for controlling the system.

3. Requested Information:

Interested businesses who believe they are capable of meeting the above requirements are requested to submit a brief (no more than 5 pages total) capabilities statement package, including company name and address, Webpage URL, point of contact with phone number and e-mail address, DUNS number, and CAGE Code. This will be intended to be a small business set-aside therefore, business size status and socioeconomic profile, detailing whether it can be considered a small business and whether any other socioeconomic category applies, such as (but not limited to), service disabled veteran owned small business, woman owned small business, small disadvantaged business, etc. For the purposes of this response, please provide business size status with respect to NAICS 334516 which has a small business size standard of 1000 employees. Interested businesses may register with System for Award Management (SAM) at http://www.sam.gov.

Respondents should include:

a. A White Paper to address a need for a Nanoscale Spectroscopic System.

b. A description of company's background, technology, experience, and any other information that demonstrates value, performance, and capabilities that supports the potential of the Nanoscale Spectroscopic System designs for better understand and control smart materials that impact signature management, multi-functionality, and thermal management.

c. A delivery time and cost summary.

d. Tailored Capability Statements addressing the Requirements of this notice, with appropriate documentation supporting claims of organization and staff capability. If significant subcontracting or teaming is anticipated in order to deliver technical capabilities, provide an estimate of anticipated subcontractor efforts.

Respondents are requested to provide information by, Friday 26 June 2020/5:00 PM Eastern Standard Time

(EST).

4. Responses:

All interested parties, regardless of size, are encouraged to respond to this sources sought notice. Submissions should include available technology, company literature, and relevant company background, experience, and qualifications.

Initial information submissions must be received by Friday 26 June 2020/5:00 PM. Responses to this notice should be directed to: Mr. Luke Renzoni, luke.r.renzoni.civ@mail.mil.

Responses shall include all information addressed above. All information supplied will be considered confidential, unless otherwise specified by the business or available from other sources without restriction.

Documents are requested to be submitted electronically in Adobe Professional (.PDF) format or Microsoft

Word (.doc, .docx). No telephonic, facsimile or hardcopy responses to this sources sought will be considered.

5. Additional Information:

All information received in response to this notice that is marked proprietary will be handled accordingly.

Any information submitted will not be returned, and no payment will be made by the Government for such information. The Government reserves the right to use information provided by respondents for any purpose deemed necessary and legally appropriate. Any organization responding to this notice should ensure that its response is complete and sufficiently detailed. Information provided will be used to assess tradeoffs and alternatives available for any potential requirement. Input on technical aspects of the responses may be solicited by SPSD from non-Government consultants/experts who are bound by appropriate non-disclosure requirements. By responding to this notice, the Respondent agrees to allow s uch input from non-Government consultants/experts concerning the information and materials submitted.