68-1032-23_1301094007 Direct Electron Detector System Specs.pdf

PDF 61 KB Posted Aug 24, 2023

Attached to: Direct Electron Detector and Analysis System for Electron-backscatter Diffraction (EBSD) Federal contract opportunity
Solicitation number: N00173-23-Q-CY27
Issued by: Department of the Navy Secretary of the Navy Office of Naval Research

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Written by GovTribe AI · Dec 21, 2023

This document outlines specifications for a direct electron detector and analysis system for electron backscatter diffraction to be provided to the Naval Research Laboratory. The system must include a direct electron detector capable of measuring patterns from 3-30kV with single electron sensitivity, 512x512 pixels, and integration times from 15-50ms. It must be able to capture and index at least 85 patterns per second with 0.1 degree orientation precision. The system must also include three computers, three EBSD analysis software licenses, two pattern simulation software licenses, a one year extended warranty, installation, demonstration and user training at NRL in Washington, DC. The contractor must provide all standard documentation and warranties are required to be included in the system price. This opportunity is identified in solicitation N00173-23-Q-CY27 issued by the Department of the Navy Secretary of the Navy Office of Naval Research for a direct electron detector and analysis system for electron backscatter diffraction.

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Specifications	for	a	direct	electron	detector	and	analysis	system	for	electron-
backscatter	diffraction	(EBSD)

The

Naval

Research

Laboratory

(NRL)

has

requirement

for

direct

electron

detector

and

analysis

system

capable

measuring

and

analyzing

electron-backscatter

diffraction

patterns

collected

using

accelerating

voltages

from

3-30

kV.

The

detector

and

analysis

system

must

consist

the

following

components

and

shall

meet

exceed

the

following

minimum

specifications.

Direct Electron Detector and Analysis System

S1. The	system’s	detector	shall	be	capable	of	measuring	electron	backscatter-diffraction
patterns	collected	using	accelerating	voltages	from	3-30	kV	in	a	field-emission
scanning	electron	microscope	(SEM).

S2. The	system’s	detector	shall	have	sensitivity	to	single	electrons,	which	demands
practically	noiseless	detection.

S3. The

system’s

detector

shall

capable

capturing

electron

backscatter

diffraction

patterns

that

can

accurately

indexed

using

electron

beam

currents

below

100

pA.

S4. The

system’s

detector

shall

have

least

512x512

pixels

with

the

capability

bin

lower

image

resolution

set

the

user.

S5. The

system’s

detector

shall

capable

least

12-bit

digital

output

for

sufficient

dynamic

range

patterns.

S6. The

system’s

detector

and

software

shall

capable

pattern

integration

times

greater

than

and

least

short

ms;

the

user

shall

able

set

this

parameter.

S7. The

system’s

detector

and

software

shall

capable

automatic

pattern

averaging

least

patterns

per

point

the

map;

this

parameter

shall

able

set

the

user.

S8. The system shall be capable of capturing and indexing at least 85 patterns per second.

S9. The	system	shall	be	capable	of	determining	crystallographic	orientation	to	0.1
degree	precision	or	better.

S10. The

system

shall

include

all

the

necessary

hardware

and

software

control

the

detector

and

synchronize

with

the

existing

SEM

site

NRL.

S11. The

system

shall

include

controls

for

inserting

and

fully

removing

the

detector

from

the

SEM

chamber

prevent

accidental

damage

the

detector.

S12. The

system

shall

capable

using

the

EBSD

detector

itself

set

forward

scatter

detectors

for

imaging

the

topography

the

region

interest

the

sample.

S13. The

system

shall

include

touch

sensor

protect

the

detector

from

collision

and

accidental

damage.

S14. The	system	shall	include	three	(3)	computers,	one	for	pattern	acquisition/analysis
and	two	for	remote	pattern	analysis,	each	with	the	following	minimum

specifications:

a. 18-core	processor	with	3.0	Ghz	(base)	4.6	Ghz	(max)	processor	clock
b. 32	GB	DDR4-2600	MHz	RAM

c. 512	GB	solid-state	primary	hard	drive
d. 12	TB	secondary	hard	drive
e. DVD	reader/writer
f. 5	PCIe	slots
g. 9	USB	3.1	ports
h. Ethernet	port	with	at	least	1	GB/s	transfer	speed
i. Windows	10	Professional	license
j. Microsoft	Office	2016	license
k. 22’’	monitor

S15. The

system

shall

include

(3)

licenses

for

EBSD

pattern

analysis

software

with

the

following

capabilities:

a. Multi-threaded operation to take advantage of multi-core computing systems

b. Hough	indexing	with	triplet	(or	quadruplet)	indexing
c. Spherical	indexing
d. Dictionary	indexing
e. Algorithms	for	averaging	nearby	similar	patterns	and	re-indexing	for

improved	signal-to-noise
f. Exporting	data	in	hdf5	format	for	compatibility	with	third-party	analysis

software

g. Visualization of inverse pole figure (IPF) maps with the capability to click on a point in the map and view and re-index the pattern from that position

h. Visualization

maps

pattern

quality

with

the

capability

click

point

the

map

and

view

and

re-index

the

pattern

from

that

position

i. Visualization

maps

indexing

confidence

with

the

capability

click

point

the

map

and

view

and

re-index

the

pattern

from

that

position

S16. The	system	shall	include	(2)	licenses	for	pattern	simulation	software	with	the
following	capabilities:

a. Simulates	EBSD	patterns	based	on	the	physics	of	dynamical	electron
diffraction	using	user-defined	experimental	parameters

b. Includes	a	library	of	master	patterns	already	calculated	for	phases	of
common	materials	at	common	operating	conditions

S17. The

system

shall

include

extended

warranty

for

year

beyond

the

expiration

the

standard

warranty

granted

all

purchasers.

This

extended

warranty

shall

include:

a. Phone	support
b. Software	updates
c. Applications	support
d. Service	visits	and	parts

Installation and Training

The

price

the

detector

must

include

delivery

the

instrument

the

U.S.

Naval

Research

Laboratory

Washington,

DC;

installation;

demonstration;

and

training.

The

on-site

installation

should

carried

out

qualified

engineer.

The

installation

should

include

on-site

validation

specified

performance

and

training

the

final

users

the

Naval

Research

Laboratory.

Documentation and Warranty

a. A

full

set

all

written

documentation

customarily

provided

the

public

with

commercial

item

shall

provided.

This

shall

include

user

manual(s)

equivalent

well

copies

any

software,

and

any

manuals

for

the

software

included

with

the

system,

customarily

provided.

This

documentation

should

received

NRL

with

the

system

hardware,

unless

other

arrangements

are

agreed

the

authorized

Government

representative.

addition

the

above

documentation

which

customarily

provided.

b. The

contractor

shall

offer

the

Government

least

the

same

warranty

terms,

including

offers

extended

warranties,

offered

the

general

public

customary

commercial

practice.

These

warranty

terms

must

included

the

system

price.

The

period

the

warranty

shall

begin

upon

acceptance.

File details come from the government source that posted it. Updated Aug 24, 2023.