Tab_02_-_Specifications.pdf
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- Spectroscope Microscope Federal contract opportunity
- Solicitation number
- 4200668061Q
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| File | Type | Posted |
|---|---|---|
| Instructions,_Terms_and_Conditions.pdf |
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An integrated system with capabilities for Confocal Raman Microscopy, Tip‐Enhanced Raman Spectroscopy, Atomic Force Microscopy and Ultraviolet‐Visible‐Near Infrared Spectroscopy with the following specifications is required.
1. The confocal Raman microscope shall be equipped with objectives for 10x and 100x.
The camera included shall be capable of both sample and laser observation.
2. The spectrometer included shall have a CCD detector with at least 1024 x 256 pixel resolution and have a wavelength range of 75 ~ 4000 cm‐1.
3. The integrated Raman system shall be equipped with the following lasers:
a. 100 mW 532 nm with resolution of at least 1.4 cm‐1
b. 30 mW 638 nm with resolution of at least 1.2 cm‐1
c. 100 mW 785 nm with resolution of at least 1.2 cm‐1
4. The confocal Raman microscope shall be equipped with software controlled sample positioning.
a. XY travel shall be at least X = 75 mm, Y = 50 mm
b. Repeatability of positioning shall be at least 1 µm ± 3 µm resolution with minimum step size of 10 nm.
c. The stage shall be capable of accommodating samples up to 500 g.
d. Z direction movement shall be controllable to minimum step size of 0.1 µm.
5. The Confocal Raman Microscope system shall accommodate an integrated Atomic Force Microscope (AFM) System controlled using a common data acquisition system.
a. The AFM shall have a motorized scanning system with range of at least 30 x 30 x 15 µm.
b. The AFM shall have an additional scanner with a scanning range of 100 x 100 x 15 µm.
c. The conductive AFM unit shall have capability for current ranges of 1 nA, 100 nA and
10 µA.
d. The AFM head shall be capable of co‐localized Raman spectroscopy, photoluminescence spectroscopy, tip‐enhanced Fluorescence, and tip‐enhanced Raman spectroscopy (TERS) including at least three protected silver probes for AFM‐ TERS and standard resolution test samples.
e. Simultaneous AFM and Raman measurements shall include capability for contact, noncontact, force modulation, conductive AFM, Kelvin probe microscopy, shear‐ force microscopy, and piezo response force microscopy.
f. The AFM shall be capable of independent operation from the Raman spectroscope to run the following analysis methods: contact, noncontact, force modulation, conductive AFM, Kelvin probe microscopy, magnetic force microscopy, electric force microscopy, force‐curve measurement, nanolithography, nanomanipulation, shear‐ force microscopy, and piezo response force microscopy.
6. The Raman AFM system shall include capability for Polarized Raman spectroscopy.
7. The Raman AFM system shall include capability for ultraviolet‐visible‐near infrared spectroscopy.
8. The Spectroscopy/Microscopy system shall be equipped with a data acquisition system, both hardware and software that can control all functionalities specified including AFM, Raman, and TERS measurements.
9. Onsite installation shall be included.
10. Operator training shall be included.
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