Specifications_-_Revised_08312018.pdf

Minimum required specifications and capabilities.

Atomic Force Microscope (AFM) is a specialized type of scanning probe microscopy that provides high resolution surface imaging of many types of samples. We require an AFM instrument that must have the following minimum requirements/capabilities:

1. Scanner capabilities

a. Coupled or Decoupled XY and Z scanners.

b. Closed loop control for XY-scanner.

c. Z-range (vertical) 15 micrometers or larger.

d. Low noise XY closed loop scan of 0.5% of scan range or better.

e. Z-scanner position detector noise of 0.1 nanometer or less.

2. Sample holders

a. Closed fluid/liquid sample holder.

b. Cooler/heater cell for temperature control from 20°C below ambient to +120°C or higher.

c. Sample mount capable of accommodating sample size up to 100 mm x 100 mm and a thickness up to 20 mm.

d. Motorized XY stage with travel range of at least 20 mm x 20 mm and Z stage travel range of at least 20 mm. XY stage travel steps must be 0.6 micrometers or less.

e. Motorized stage for AFM head movement in the Z direction with travel range of at least 20 mm. Z stage travel steps must be 0.08 micrometers or less.

3. Sealed acoustic enclosure to block external acoustic and light noise.

4. Vibration isolation table to cancel out the floor vibrations.

5. 1.2 Megapixel or higher Camera with a field of view of at least 480 micrometer x 360 micrometer (with 10x objective lens).

6. Mode/capabilities

a. Contact mode

b. AC/tapping mode

c. Phase Imaging

d. Imaging in liquid environment

e. Force Spectroscopy

f. Kelvin Probe Force Microscopy (KPFM)

g. Piezoresponse Force Microscopy

h. Lateral Force Microscopy (LFM)

i. Electric/Electrostatic Force Microscopy (EFM)

j. Magnetic Force Microscopy (MFM)

k. Nanolithography

l. Nanomanipulation

m. Nanoindentation

7. Computer with monitor and software capable of creating experimental protocols and collecting/analyzing AFM data.

8. Instrument installation and training