This STTR Phase I grant award from the National Science Foundation (NSF) under the Technology, Innovation, and Partnerships (TIP) program supports the development of a compact, multi-wavelength interferometric system for real-time, in-situ metrology in high-precision optical manufacturing. The $274,524 project aims to deliver a market-ready, on-machine metrology system that can improve efficiency and accuracy in diamond tool alignment, surface metrology, and overall manufacturing throughput by 30-50%. Key anticipated outcomes include a prototype of the on-machine metrology system, associated software development, and performance validation. Subawards are planned as part of this effort. The broader commercial impact of this technology is expected to be transformative for precision optical manufacturing, additive manufacturing, and precision machining industries by enabling real-time quality control during fabrication.
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