Acquisition of a Preventive Maintenance Agreement for JPK NanoWizard®
INTRODUCTION THIS IS A PRE-SOLICITATION NON-COMPETITIVE (NOTICE OF INTENT) SYNOPSIS TO AWARD A CONTRACT OR PURCHASE ORDER WITHOUT PROVIDING FOR FULL OR OPEN COMPETITION (INCLUDING BRAND-NAME). The National Institutes of Health, Eunice Kennedy Siver National Institute of Child Health and Human Development (NICHD), Office of Acquisitions (OA) on behalf of the on behalf of the National Institute of Digestive, Diabetes & Kidney Diseases intends to award a purchase order without providing for full and open competition (Including brand-name) to BRUKER NANO INC for the acquisition of a Preventive Maintenance Agreement for JPK NanoWizard®. NORTH AMERICAN INDUSTRY CLASSIFICATION SYSTEM (NAICS) CODE The intended procurement is classified under NAICS code 811210 with a Size Standard of $30.0. REGULATORY AUTHORITY The resultant contract will include all applicable provisions and clauses in effect tough the Federal Acquisition Circular 2022-08 Effective October 28, 2022. This acquisition is conducted under the procedures as prescribed in FAR subpart 13—Simplified Acquisition Procedures at an amount not exceeding the simplified acquisition teshold ($250,000). STATUTORY AUTHORITY This acquisition is conducted under the authority of 41 U.S.C. 253(c) under provisions of the statutory authority of FAR Subpart 6.302- FAR 6.302-1—Only one responsible source and no other supplies or services will satisfy agency requirements 41 U.S.C. 253(c)(1). PERIOD OF PERFORMANCE Base Year: 1/1/2023 - 12/31/2023 Option Year 1: 1/1/2024 - 12/31/2024 Option Year 2: 1/1/2025 - 12/31/2025 Place of Performance National Institutes of Health National Institute of Digestive, Diabetes & Kidney Diseases 5 Memorial Drive Bethesda, MD 20892   DESCRIPTION OF REQUIREMENT The mission of the National Institutes of Health (NIH) is to seek fundamental knowledge about the nature and behavior of living systems and to apply that knowledge to enhance health, lengthen life, and reduce illness and disability. As part of the NIH, the National Institute of Diabetes and Digestive and Kidney Diseases (NIDDK) Intramural Research Program (IRP) conducts biomedical research and training related to diabetes mellitus; endocrine, bone, and metabolic diseases; digestive diseases, including liver diseases and nutritional disorders; and kidney, urologic, and hematologic diseases. Intramural research is conducted in the Institute's laboratories and clinical facilities in Bethesda, Maryland and in Phoenix, Arizona. Miroshnikova lab and the Section on Nuclear Mechanotransduction and Cell Fate Dynamics is part of Laboratory of Molecular Biology (LMB), which is one of NIDDK IRP 17 Laboratories and Branches. Miroshnikova lab’s work requires, on an ongoing basis, advanced mechanical characterization methods to qualitatively complement other assays, as well as quantitate the major experimental conditions of the section in living cells and organisms. JPK’s atomic force microscope is leading, high-resolution system combing atomic resolution and fast scanning with rates of up to 150 lines/sec and a large scan range of 100µm in one system allowing cell-cell force quantification in addition to mechanical properties of cells, organelles and tissues. It is designed to provide highest mechanical and thermal stability on inverted optical microscopes during long term experiments on samples ranging from single molecules to living cells and tissues. Thus, it is ideal for live cell and tissue/organism imaging and quantitation, which is at the core of Miroshnikova lab operations. _________________________ PURPOSE AND OBJECTIVES In order to accomplish the goals of this program, The National Institutes of Health (NIH), National Institute of Diabetes and Digestive and Kidney Diseases (NIDDK), has a requirement to obtain a preventive maintenance agreement for our new live-sample microscope system with DirectOverlay™ 2 software compatibility for perfect integration and data correlation with advanced fluorescence microscopy platforms; meaning that this system allows calibration of optical images and precisely overlay both the optical and the AFM images. This system conducts mechanical characterization and cell-cell adhesion measurements due to 100micron z scan size, as well as side visualization of the sample. . SALIENT / REQUIRED FEATURES AND SPECIFICATIONS The new equipment needs a yearly maintenance to ensure accurate readings and repeatability. These operations must remain in continuous working order. Thus a preventive maintenance package needs to remain on this unit at all time to ensure that there will be no down time for this instrument which would disrupt continue research and our NIH mission. Atomic Force Microscope (AFM) System AFM Head • Multi-purpose stand-alone tip-scanning design • Closed-loop atomic lattice resolution (mica in buffered solution) on inverted microscope under suitable environmental conditions • Drift minimized concentric design • Available sample size Ø140mm x18mm; unlimited for large samples due to tip-scanning design • Head completely sealed against vapor and liquids • High Resolution Mode (HRM) delivers atomic resolution (mica lattice in air or buffered solution) on inverted microscope under suitable environmental conditions (active vibration isolation and acoustic enclosure) • Lowest cantilever deflection noise of any commercial AFM (<2pm RMS) • Bandwidth of deflection-detection: 8 MHz • Thermal noise cantilever calibration up to 3.25 MHz • Supported imaging modes in air and liquid: o PeakForce Tapping™ for easy and straight forward imaging (SW-06-10) o Contact mode with lateral force (LFM), o TappingMode™ with Phase Imaging, QI™ mode, AC modes with optional Q-control, higher harmonics, FM or PM-AFM, MFM, o Electrical modes, magnetic modes, mechanical modes with optional accessories • Supported non-imaging modes: o Force-distance spectroscopy, other point spectroscopy o Fast force mapping, o Optional advanced modes and lithography/manipulation • Scanner specifications: o Advanced closed loop control for lowest settling time and prevention of overshoot and ringing o Z axis mechanically decoupled from XY scanner o 3 axis capacitive position sensors for closed-loop operation o Z-noise (in feedback): <30pm RMS o XY scan range: 100μm x 100μm (<90pm RMS sensor noise level) o Z scan range: 15μm (<40pm RMS sensor noise level) • IR low-coherence light source with vertical incidence • Designed for integration with inverted optical microscopes supporting fluorescence, confocal laser scanning microscopy, TIRF, Raman, and many more • Optical filters for elimination of cross talk with fluorescence illumination • High transmission optical access from top and bottom for condenser illumination and optical viewing • In-situ switch from air to liquid operation • Physical access to cantilever region from all sides (e.g. micro pipettes) • Tee precision motors for automatic approach and tilt-correction • Stand for AFM head included • Includes SP-90-08 JPK Cantilever holder with fixed spring • Cantilever holder is easy to clean with detergents, certain solvents and ultrasonic bath • Stand for AFM head included JPK Head • Contains exchangeable single cell force sensor holder and force measurement system in a rugged, compact chassis • Precise force measurements on single cells with single molecule resolution • Determination of interaction strength, mechanical response, elasticity, and distances on the nanoscale • 100μm vertical sensor movement range for complete cell-substrate separation • Tee stepper motors for automated sensor approach • Compatible with top-view optical systems such as JPK TopViewOptics™ or Macroscopes from Zeiss, Olympus or Leica • Vertical optical access for phase contrast and DIC illumination with standard condenser optics • Full compatibility with inverted optical microscopes (e.g. Zeiss Axio Observer, Olympus IX series, Nikon TE, Ti, Ti2, Leica DMI) • Compatible with advanced optical techniques such as TIRF, FRAP, etc. and confocal laser scanning microscopy • Zero crosstalk with fluorescence techniques tough infrared laser-based force measurement system (880nm) • Easy and safe operation in liquids • Suitable for use in microscope incubators • Open design for use with Petri dishes (height < 10.5 mm), shallow fluid containers, liquid perfusion, and CO2 enriched gas flow • Available sample size Ø140mm x18mm; unlimited for large samples due to tip-scanning design • Head completely sealed against vapor and liquids • Optical filters for elimination of cross talk with fluorescence illumination • In-situ switch from air to liquid operation • Physical access to cantilever region from all sides (e.g. micro pipettes) • Stand for AFM head included • Includes SP-90-08 JPK Cantilever Holder fixed spring • Cantilever holder is easy to clean with detergents, certain solvents and ultrasonic bath Light Source • 980nm light source for better separation from VIS range • Recommended in combination with Super-resolution techniques such as PALM/STORM if optical focus tracking is needed • Laser cleaning filter for shorter wavelength background suppression • Low coherence for suppressing interference JPK SPM Controller • Full featured low-noise high-performance digital SPM controller • High speed data capture with maximum data pixel rate up to 800.000 pixels/sec • Modular hybrid analog/digital design with latest FPGA/PPC technology (dual core PowerPC @ 1,4 GHz) overcoming limitations of conventional DSP designs • 2 high speed 16bit ADC channels with 60 MHz sample rate • 6 18bit ADC channels with 800 kHz sample rate • 1 high speed 14bit DAC channel with 120 MHz sample rate • 4 20bit DAC channels with 800 kHz sample rate • 1 high-speed lock-in amplifier for precise amplitude and phase detection • 3 channel low noise capacitive distance sensor interface • Thermal noise cantilever calibration up to 3.75 MHz • Low voltage output for electronics modules and pre-amplifiers with +/-15V and +/-5V • Digital input: 6 channels (Sub-D) Digital output: 10 channels (Sub-D) e.g. for pixel and line clock • Easy Connection of Accessories at the front panel • CE compliant • Connection to control PC by 2 Gigabit LAN o Stand-alone PC configuration: o Power supply - 520 Watt NT Modular o Supermicro X11SAE o Intel Core i7-6700 16GB (2x 8GB, DDR4-RAM) o Arctic Cooling Freezer 13 CO 92 mm o HD1: SAMSUNG SSD 800 256GB HD2: SATA-600 WD WDC- WD40EZRZ-00W, 4TB o HD2: SATA-600 WD WDC-WD40EZRZ-00W, 4TB o NVIDIA GP107 GeForce GTX 1050 Ti (4 GB RAM) o DVD-RW +/- RW o Keyboard and mouse o 1 x 32” TFT display (or better configuration) o Ubuntu OS with pre-configured JPK SPM software (or better configuration) Software JPK SPM Control Software with workflow-based design • Optical Microscopy-inspired, ergonomic, and easy-to-use graphical user interface • Reliable Linux ® based SPM-software for data-acquisition with scripting language (Jython) for user developments • Images with arbitrary pixel resolution • Simultaneous acquisition of up to 25 channels • Picture-in-picture display for easy navigation and zooming • ForceWatch™ mode for preventing force drift of the cantilever • Outline™ mode for easy navigation • TipSaver™ and RelativeForce™ mode for force measurements • Online four channel oscilloscopes with FFT functions • Command line interface for low level access • Complete support of external hardware and accessories • Cantilever calibration tough thermal noise or Sader method • Automated sample tilt correction with the 3 stepper motors JPK Control Software • Optical Microscopy inspired, ergonomic and easy-to-use graphical user interface • Java based for use with Linux® or Windows® • Designed for bio and soft matter analysis • Icon-based history of processing steps • All major SPM force spectroscopy processing modules • Advanced filtering module • Advanced leveling module, includes histogram fit, and curve fit • Force curve module including batch processing with a variety of fitting routines such as step fitting, WLC, FJC, JKR, DMT and more • Site license with free upgrades • Easy-to-use Java based graphical user interface • Guided sensor adjustment and force calibration procedure • Flexible configuration of force measurement experiments e.g. simple force- distance, multi-step movements, holding at pre-defined height/force etc. • Complete control of parameters like contact force, pulling range, contact time, movement speed etc. • Complete logging of all experimental parameters (position, force, temperature etc.) • Continuous generation of force distance curves with pre-selected parameters • Cell capture mode for easy cell-sensor attachment • Data export as raw and calibrated data • Macro programming for complex user-defined experiments JPK DP Data Processing (DP) Software • Optical Microscopy inspired, ergonomic and easy-to-use graphical user interface • Java based for use with Linux® or Windows® • Designed for bio and soft matter imaging and analysis • Icon-based history of processing steps • All major SPM image processing modules • Advanced filtering module • Advanced leveling module, includes histogram fit, and curve fit • Force curve module including batch processing with a variety of fitting routines such as step fitting, WLC, FJC and more • Batch processing for images with a variety of fitting routines such as JKR, DMT and more • Cross section and distance measurements • RMS roughness determination • 3D rendering module • Site license with free upgrades Starter Kits JPK NanoWizard® and CellHesion® 200 Starter Kit • Tweezers and cantilever exchange tool • Includes JPK Sample holder for small samples (AC-00-02) • Cantilevers: o 10x Bruker TESP o 10x Bruker Peakforce-HIRES-F-A o 10x Bruker Peakforce-HIRES-F-B o 10x Bruker FESP-V2 o 10x tipless cantilevers for cell adhesion experiments JPK NanoWizard® 4XP Starter Kit • Tweezers and cantilever exchange tool • Includes JPK Sample holder for small samples (AC-00-02) • Cantilevers: o 10x Bruker TESP-V2 o 10x Bruker Peakforce-HIRES-F-A o 10x Bruker Peakforce-HIRES-F-B o 10x Bruker FESP-V2 Software Modules JPK DirectOverlay™ 2 Software Module • Improved user-friendly workflow • Automatic calibration of the optical image • Compensation of optical aberration and distortion • Direct read-out of selected cameras or import from other sources • AFM scan selection in the optical background image • Adjustable transparency of the overlaid images JPK QI™- Advanced 2 Software Module • Second generation QI™ Quantitative Imaging: more reliable and faster imaging • Extends the functions of the QI™ Quantitative Imaging mode • Works across all stiffness ranges including soft and strongly adhesive samples in liquid • Online calculation of stiffness and adhesion • Full storage of all force curves and channels for post-processing • Simultaneous acquisition of external data e.g. Conductive AFM (with JPK CAFM module) Stages and Accessories • Compatible with inverted microscopes from Zeiss, Nikon, Leica and Olympus. • Sensitive joystick control • Travel range: >20mm x 20 mm • Step size (Resolution): ≤1 μm • Repeatability (unidirectional): ≤2 μm • Maximum velocity: 1mm/s • Compatible with all JPK sample carriers e.g., for glass slides, Petri dishes, coverslips, metal discs, etc. • Please specify the microscope model when ordering Fluid Cells and Temperature Control • Insert for Life Science stage • Temperature range: Room temperature up to 60° • Compatible with 35x10mm Petri dishes from WPI and TPP (plastic or plastic with glass bottom) • Adaptors for other suppliers such as Matek, Willco, IWAKI, Ibidi, and BC upon request • Ports for perfusion tubes and gas supply (only available for certain types of Petri dishes) • Silicone anti-evaporation seal • Software control • Temperature stability 0.1 K • Please specify the inverted microscope model when ordering Systems and Configurations for all systems JPK TopView Optical module to view tip and sample • Integrated camera with images captured directly into the AFM software • Can be mounted on the AFM head while the head is mounted on the inverted fluorescence microscope as well as standalone • Top down view perpendicular to sample plane • Magnification 10x • Up to 5MP, frame rate max 9 FPS • Camera connection type USB 2.0 • Please specify the Head (H-XX-XX) JPK SideView™ cantilever holder - Side View • Super cut, fixed spring, length: 15.5 mm • Cantilever holder with precise mounted mirror • Allows both view from below and front of cantilever • Visual observation of tip-sample region e.g. for cell pick-up • Compatible with aqueous solutions and epi-illumination • Available numerical aperture: 0.3 *Objectives with minimum 4mm working distance required (20x recommended). Sideview and Hybrid stage Nikon are compatible. Microscopy Kits JPK Optical System Data Communication Kit • Ubuntu file transfer between JPK SPM and another optical image system for data transfer for DirectOverlay™ • With hardware (network switch, network cables and TTL-cable with BNC connection) C-mount 1.0x camera adapter SlimFocus objective lens z-Scanner • SlimFocus z tracking with position sensor for microscope objectives • Digital controller • 1.5m cable • Objective lens adapter • SlimFocus z tracking software • Range (open loop/closed loop): 180μm/150μm • Resolution (open loop/closed loop): 1.5nm • 2 BNC cable 2 m length Vibration and Acoustic Isolation Benchtop Active Vibration Isolation System • Approved for use with JPK NanoWizard® AFM • Active bandwidth 0.6 Hz – 200 Hz • Isolation: 40 dB above10 Hz • Dimensions: 400 x 500 x 85 mm³ • Weight: 20kg • External power supply TASKS AREAS Independently, and not as an agent of the Government, the contractor shall perform all of the detailed Task Areas listed below: Task Area 1 – Service Agreement The Contractor shall provide service coverage(s) that include, but not limited to a one-time (1) onsite full preventative maintenance inspection per agreement year including software updates. Task Area 2 – Maintenance The maintenance for this requirement will be performed once per year at a time that suits the Miroshnikova lab. Task Area 3 – Warranty The warranty will be provided by the manufacturer and serviced by their local service engineer(s) and will be no less than 1 year from completion of any additional installation, covering all deliverables, labor, labor and travel, minus consumables. Task Area 4 – Training The vendor will provide online training and 1 free seat at a Bruker facility if required. CONTRACTING WITHOUT PROVIDING FOR FULL OR OPEN COMPETITION (INCLUDING BRAND-NAME) DETERMINATION The determination by the Government to award a contract without providing for full and open competition is based upon the market research conducted as prescribed in FAR Part 10—Market Research. Only one source is available: Per FAR 13.106-1(b)(1) the Contracting Officer has determined BRUKER NANO INC to be the only reasonable available source to provide a Preventive Maintenance Agreement for JPK NanoWizard®. This acquisition was pursued on a sole source basis centered on the fact that Bruker is the manufacturer of the equipment to be maintained. They have access to manufacturer required parts and the only specially trained technicians to maintain the equipment and promptly get the system back working should there be any break in service. Bruker will be able to quickly perform the preventive maintenance required to maintain the accuracy of the unit without delays. This is a unique system and the only one of its kind at NIH, making it vital that the equipment continue performing in order to not delay or invalidate ongoing research. Bruker, as the manufacturer, is the only vendor capable of maintaining the equipment. Miroshnikova lab’s work requires, on an ongoing basis, advanced mechanical characterization methods to qualitatively complement other assays, as well as quantitate the major experimental conditions of the section in living cells and organisms. JPK’s atomic force microscope is leading, high-resolution system combing atomic resolution and fast scanning with rates of up to 150 lines/sec and a large scan range of 100µm in one system allowing cell-cell force quantification in addition to mechanical properties of cells, organelles and tissues. It is designed to provide highest mechanical and thermal stability on inverted optical microscopes during long term experiments on samples ranging from single molecules to living cells and tissues. Thus, it is ideal for live cell and tissue/organism imaging and quantitation, which is at the core of Miroshnikova lab operations. As this is a newer technology, only Bruker can manage and maintain their new technology properly to ensure reproducibility and accurate and consistent readings. The Miroshnikova lab does not have the specialized, proprietary training needed to fix this instrument. This leaves us with 3 options; (1) episodic per-event payment for repair, (2) direct contract with the instrument vendor, or (3) contracting with an insurance/service management provider as a 3rd party which would indirectly pay for instrument service. Because of the limited number of certified technicians and finite number of spare parts, the episodic approach leads to very long delays in instrument servicing. Disincentives for faster, more expensive repair (where excess parts used in addressing potential approaches to fixing the instrument cannot easily be returned to the contract engineer’s company, BRUKER NANO INC will reduce the efficiency of the 3rd party solution. This results in the need for a direct contracting solution, which is the most effective way of maintaining the instrument. The savings between options 2 and 3 are not as significant relative to the internal revenue from cost recovery which would be lost if there were just a few delays in repair (especially as knock-on effects lead to disproportionate delays in many types of project support). The JPK NanoWizard® is a highly specialized piece of equipment that requires skilled technicians above and beyond what is typically seen with standard scientific equipment. Direct service by the vendor is superior to third party insurance-like coverage because service provided by technicians from the vendor include delivery of multiple fix kits to cover a single issue prior to a service call. Third party providers are unable to support a rapid response time to service calls. As no other vendors are certified/qualified to provide the high level of specified maintenance and/or repairs needed to keep the functioning at optimum levels. Failure to use BRUKER NANO INC to service the JPK NanoWizard® and its many components may result in voiding any manufacturer warranties on the, JPK NanoWizard® delays for software upgrades and repairs, and could result in inaccurate research results that in turn could result in Miroshnikova lab’s failure to meet its mission. CLOSING STATEMENT This synopsis is not a request for competitive proposals. However, interested parties may identify their interest and capability to respond to this notice. Responses to this notice shall contain sufficient information to establish the interested parties’ bona-fide capabilities for fulfilling the requirement and include: descriptive literature, delivery timeframe, warranties and/or other information that demonstrates that the offer meets all the foregoing requirements, the prompt payment discount terms, the F.O.B. Point (Destination or Origin), the Dun & Bradstreet Number (DUNS), the Taxpayer Identification Number (TIN), and the certification of business size. All offerors must have an active registration in the System for Award Management (SAM) www.sam.gov.” A determination by the Government not to compete this proposed contract based upon responses to this notice is solely within the discretion of the Government. The information received will normally be considered solely for the purposes of determining whether to proceed on a non-competitive basis or to conduct a competitive procurement. All responses to this notice shall be submitted electronically by 9:00 am Eastern Standard Time, on Tuesday, December 27, 2022 to the Contract Specialist, Amber Harris, at amber.harris@nih.gov . Assessment of Capability Lowest Price Technically Acceptable
NICHD-23-041 Department of Health and Human Services National Institutes of Health National Institute of Child Health and Human Development
12/15/22, 2:24 PM